Detail výsledku

27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

DENIZIAK, S.; SITEK, P.; JENIHHIN, M.; STEININGER, A.; SCHÖLZEL, M.; MRÁZEK, V. 27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Kliece: Institute of Electrical and Electronics Engineers, 2024. 155 p. ISBN: 979-8-3503-5934-3.
Typ
konferenční sborník (ne stať)
Jazyk
anglicky
Autoři
DENIZIAK, S.
SITEK, P.
JENIHHIN, M.
Steininger Andreas, Prof. Dr.
SCHÖLZEL, M.
Mrázek Vojtěch, Ing., Ph.D., UPSY (FIT)
Abstrakt

This proceedings contains reviewed papers accepted for publication and presentation at the 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2024). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.

Klíčová slova

electronic circuit, design, test, design method, digital circuit, analog circuit

URL
Rok
2024
Strany
155
Konference
International Symposium on Design and Diagnostics of Electronic Circuits and Systems
ISBN
979-8-3503-5934-3
Vydavatel
Institute of Electrical and Electronics Engineers
Místo
Kliece
DOI
BibTeX
@proceedings{BUT188622,
  editor="DENIZIAK, S. and SITEK, P. and JENIHHIN, M. and STEININGER, A. and SCHÖLZEL, M. and MRÁZEK, V.",
  title="27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
  year="2024",
  pages="155",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Kliece",
  doi="10.1109/DDECS60919.2024",
  isbn="979-8-3503-5934-3",
  url="https://ieeexplore.ieee.org/servlet/opac?punumber=10508803"
}
Projekty
Application-specific HW/SW architectures and their applications, VUT, Vnitřní projekty VUT, FIT-S-23-8141, zahájení: 2023-03-01, ukončení: 2026-02-28, řešení
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