Detail výsledku

Behavior of CMOS Polymorphic Circuits in High Temperature Environment

RŮŽIČKA, R.; ŠIMEK, V.; SEKANINA, L. Behavior of CMOS Polymorphic Circuits in High Temperature Environment. Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems. Cottbus: IEEE Computer Society, 2011. p. 447-452. ISBN: 978-1-4244-9753-9.
Typ
článek ve sborníku konference
Jazyk
anglicky
Autoři
Růžička Richard, doc. Ing., Ph.D., MBA, UPSY (FIT)
Šimek Václav, Ing., UPSY (FIT)
Sekanina Lukáš, prof. Ing., Ph.D., UPSY (FIT)
Abstrakt

The paper describes a series of experiments performed with the aim to analyze the fundamental impact of high temperatures on behavior of polymorphic digital circuits. These experiments were conducted using a reconfigurable polymorphic chip REPOMO32 which is configured (in addition to the configuration bit stream) using the level of power supply voltage (Vdd). Experiments show that polymorphic gates in the chip can be easily involved (in terms of functionality) not only by Vdd, but also by temperature. Because experiments also prove that the physical design of the REPOMO32 chip is robust enough to keep the functionality of all circuitry of the REPOMO32 and its dynamic parameters are stable enough under wide range of operating temperature, the chip can also be used for future designs of digital polymorphic circuits controlled by temperature.

Klíčová slova

Polymorphic digital circuits, polymorphic gates, reconfigurable circuits, temperature-aware design.

Rok
2011
Strany
447–452
Sborník
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
Konference
IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2011
ISBN
978-1-4244-9753-9
Vydavatel
IEEE Computer Society
Místo
Cottbus
BibTeX 
@inproceedings{BUT76318,
  author="Richard {Růžička} and Václav {Šimek} and Lukáš {Sekanina}",
  title="Behavior of CMOS Polymorphic Circuits in High Temperature Environment",
  booktitle="Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
  year="2011",
  pages="447--452",
  publisher="IEEE Computer Society",
  address="Cottbus",
  isbn="978-1-4244-9753-9",
  url="https://www.fit.vut.cz/research/publication/9581/"
}
Soubory
Projekty
Natural computing na nekonvenčních platformách, GAČR, Standardní projekty, GAP103/10/1517, zahájení: 2010-01-01, ukončení: 2013-12-31, řešení
Pokročilé bezpečné, spolehlivé a adaptivní IT, VUT, Vnitřní projekty VUT, FIT-S-11-1, zahájení: 2011-01-01, ukončení: 2013-12-31, ukončen
Výzkum informačních technologií z hlediska bezpečnosti, MŠMT, Institucionální prostředky SR ČR (např. VZ, VC), MSM0021630528, zahájení: 2007-01-01, ukončení: 2013-12-31, řešení
Výzkumné skupiny
Výzkumná skupina Evolvable Hardware (VZ EHW)
Pracoviště
Ústav počítačových systémů (UPSY)
Nahoru